Effects of Xe content on wall-voltage variation during address period in AC plasma-display panel

Soo-Kwan Jang Choon-Sang Park Heung-Sik Tae (SID Member) Bhum Jae Shin (SID Member) Jeong Hyun Seo (SID Member) Eun-Young Jung Abstract — To investigate the influence of the gas condition, especially xenon (Xe) gas, on the wallvoltage variation in relation to the electric-field intensity during the address period, the wall voltages were measured under various Xe-gas content ranging from 11 to 20% by using the Vt closed curve analysis method. It was observed that under a weak electric-field intensity between the scan and address electrodes, the change in Xe content did not affect the wall-voltage variation, even at a higher panel temperature of 65°C. However, under a strong electric-field intensity, the wall-voltage variations were reduced with an increase in the Xe content, confirming that a higher electric-field intensity would be required to induce the wall-voltage variation at a higher Xe content during the address period.